| dc.contributor.advisor |
Navrátil, Milan
|
|
| dc.contributor.author |
Martínek, Tomáš
|
|
| dc.date.accessioned |
2013-10-14T10:51:46Z |
|
| dc.date.available |
2013-10-14T10:51:46Z |
|
| dc.date.issued |
2013-02-08 |
|
| dc.identifier |
Elektronický archiv Knihovny UTB |
cs |
| dc.identifier.uri |
http://hdl.handle.net/10563/25429
|
|
| dc.description.abstract |
Tato diplomová práce se zabývá zobrazovacími metodami mikroskopie se skenující sondou a skenovacím systémem Agilent 5420 SPM/AFM od společnosti Agilent Technologies. Možnosti tohoto systému jsou zanalyzovány a demonstrovány na několika praktických aplikacích. |
cs |
| dc.format |
57 s. |
cs |
| dc.format.extent |
28292959 bytes |
cs |
| dc.format.mimetype |
application/zip |
cs |
| dc.language.iso |
cs |
|
| dc.publisher |
Univerzita Tomáše Bati ve Zlíně |
|
| dc.rights |
Bez omezení |
|
| dc.subject |
Mikroskopie atomárních sil
|
cs |
| dc.subject |
skenovací mikrovlnná mikroskopie
|
cs |
| dc.subject |
metrologie
|
cs |
| dc.subject |
vizualizace
|
cs |
| dc.subject |
Atomic Force Microscopy
|
en |
| dc.subject |
Scanning Microwave Microscopy
|
en |
| dc.subject |
Metrology
|
en |
| dc.subject |
Visualization
|
en |
| dc.title |
Zobrazování struktur elektronických systémů užitím skenovací mikrovlnné mikroskopie<br> |
cs |
| dc.title.alternative |
The Projection of Electronic Systems' Structures Using Scanning Microwave Microscopy<br> |
en |
| dc.type |
diplomová práce |
cs |
| dc.contributor.referee |
Nosková, Klára |
|
| dc.date.accepted |
2013-06-18 |
|
| dc.description.abstract-translated |
This diploma thesis deal with imaging methods of Scanning Probe Microscopy and scanning system Agilent 5420 SPM/AFM from Agilent Technologies. Possibilities of this system are analyzed and demonstrated by several practical applications. |
en |
| dc.description.department |
Ústav elektroniky a měření |
cs |
| dc.description.result |
obhájeno |
cs |
| dc.parent.uri |
http://hdl.handle.net/10563/153
|
cs |
| dc.parent.uri |
http://hdl.handle.net/10563/220
|
cs |
| dc.thesis.degree-discipline |
Bezpečnostní technologie, systémy a management |
cs |
| dc.thesis.degree-discipline |
Security Technologies, Systems and Management |
en |
| dc.thesis.degree-grantor |
Univerzita Tomáše Bati ve Zlíně. Fakulta aplikované informatiky |
cs |
| dc.thesis.degree-grantor |
Tomas Bata University in Zlín. Faculty of Applied Informatics |
en |
| dc.thesis.degree-name |
Ing. |
cs |
| dc.thesis.degree-program |
Inženýrská informatika |
cs |
| dc.thesis.degree-program |
Engineering Informatics |
en |
| dc.identifier.stag |
31285
|
|
| utb.result.grade |
A |
|
| dc.date.submitted |
2013-05-29 |
|
| local.subject |
AFM (mikroskopie)
|
cs |
